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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test  Cover Image E-book E-book

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev.

Pavlov, Andrei. (author.). Sachdev, Manoj. (author.). SpringerLink (Online service) (Added Author).

Record details

  • ISBN: 9781402083631
  • Physical Description: online resource.
  • Publisher: Dordrecht : Springer Netherlands, 2008.
Subject: Engineering.
Memory management (Computer science).
Systems engineering.
Engineering.
Circuits and Systems.
Memory Structures.

Electronic resources


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