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| 01546nam a22004095i 4500 |
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| 001 | 35697 |
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| 003 | CONS |
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| 005 | 20140829185812.0 |
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| 007 | cr nn 008mamaa |
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| 008 | 100301s2008 gw | s |||| 0|eng d |
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| 020 | | . |
‡a9783540738862
‡9978-3-540-73886-2 |
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| 024 | 7 | . |
‡a10.1007/978-3-540-73886-2
‡2doi |
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| 035 | | . |
‡a(DE-He213)978-3-540-73886-2 |
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| 100 | 1 | . |
‡aFultz, Brent.
‡eauthor. |
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| 245 | 1 | 0. |
‡aTransmission electron microscopy and diffractometry of materials /
‡cby Brent Fultz, James M. Howe. |
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| 250 | | . |
‡aThird Edition. |
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| 264 | | 1. |
‡aBerlin, Heidelberg :
‡bSpringer Berlin Heidelberg,
‡c2008. |
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| 300 | | . |
‡bonline resource. |
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| 336 | | . |
‡atext
‡btxt
‡2rdacontent |
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| 337 | | . |
‡acomputer
‡bc
‡2rdamedia |
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| 338 | | . |
‡aonline resource
‡bcr
‡2rdacarrier |
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| 347 | | . |
‡atext file
‡bPDF
‡2rda |
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| 650 | | 0. |
‡aChemistry. |
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| 650 | | 0. |
‡aParticles (Nuclear physics). |
|---|
| 650 | | 0. |
‡aCrystallography. |
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| 650 | | 0. |
‡aSurfaces (Physics). |
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| 650 | 1 | 4. |
‡aChemistry. |
|---|
| 650 | 2 | 4. |
‡aCharacterization and Evaluation of Materials. |
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| 650 | 2 | 4. |
‡aSurfaces and Interfaces, Thin Films. |
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| 650 | 2 | 4. |
‡aCrystallography. |
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| 650 | 2 | 4. |
‡aSolid State Physics and Spectroscopy. |
|---|
| 650 | 2 | 4. |
‡aPhysics and Applied Physics in Engineering. |
|---|
| 700 | 1 | . |
‡aHowe, James M.
‡eauthor. |
|---|
| 710 | 2 | . |
‡aSpringerLink (Online service) |
|---|
| 773 | 0 | . |
‡tSpringer eBooks |
|---|
| 776 | 0 | 8. |
‡iPrinted edition:
‡z9783540738855 |
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| 856 | 4 | 0. |
‡uhttp://biblioteca.ipicyt.edu.mx:2048/login?url=http://dx.doi.org/10.1007/978-3-540-73886-2
‡yTexto completo
‡9CONS |
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| 950 | | . |
‡aChemistry and Materials Science (Springer-11644) |
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| 901 | | . |
‡a35697
‡b
‡c35697
‡tbiblio
‡sSystem Local |
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