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Transmission electron microscopy and diffractometry of materials / by Brent Fultz, James Howe.

ISBN: 9783642297618
Physical Description: 1 recurso en línea.
Edition: 4th ed.
Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2013.

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020		.	‡a9783642297618 ‡9978-3-642-29761-8
024	7	.	‡a10.1007/978-3-642-29761-8 ‡2doi
035		.	‡a(DE-He213)978-3-642-29761-8
050		4.	‡aQC450-467
050		4.	‡aQC718.5.S6
100	1	.	‡aFultz, Brent. ‡eauthor.
245	1	0.	‡aTransmission electron microscopy and diffractometry of materials / ‡cby Brent Fultz, James Howe.
250		.	‡a4th ed.
264		1.	‡aBerlin, Heidelberg : ‡bSpringer Berlin Heidelberg, ‡c2013.
300		.	‡a1 recurso en línea.
336		.	‡atexto ‡btxt ‡2rdacontent
337		.	‡acomputadora ‡bc ‡2rdamedia
338		.	‡arecurso en línea ‡bcr ‡2rdacarrier
347		.	‡aArchivo de texto ‡bPDF ‡2rda
490	1	.	‡aGraduate Texts in Physics, ‡x1868-4513
650		0.	‡aPhysics.
650		0.	‡aSpectroscopy.
650		0.	‡aSurfaces (Physics).
650	1	4.	‡aPhysics.
650	2	4.	‡aSpectroscopy and Microscopy.
650	2	4.	‡aCharacterization and Evaluation of Materials.
650	2	4.	‡aSpectroscopy/Spectrometry.
650	2	4.	‡aSurfaces and Interfaces, Thin Films.
650	2	4.	‡aSurface and Interface Science, Thin Films.
700	1	.	‡aHowe, James.
710	2	.	‡aSpringerLink (Online service)
773	0	.	‡tSpringer eBooks
776	0	8.	‡iPrinted edition: ‡z9783642297601
830		0.	‡aGraduate Texts in Physics, ‡x1868-4513
856	4	0.	‡uhttp://biblioteca.ipicyt.edu.mx:2048/login?url=http://dx.doi.org/10.1007/978-3-642-29761-8 ‡yTexto completo ‡9CONS
950		.	‡aPhysics and Astronomy (Springer-11651)
901		.	‡a42075 ‡b ‡c42075 ‡tbiblio ‡sSystem Local