Large-angle convergent-beam electron diffraction (LACBED) : applications to crystal defects / Jean Paul Morniroli.
Record details
- ISBN: 9782901483052
- Physical Description: xii, 431 páginas : ilustraciones ; 23 cm.
- Publisher: Paris : Société Française des Microscopies, [2002].
Content descriptions
| Bibliography, etc. Note: | Incluye bibliografía e índice. |
| Immediate Source of Acquisition Note: | IPICYT ; Proyecto / Dr. Miguel Avalos Borja / CONACYT-FONDOS Sectoriales-SEP-S-3172 / R.1632-P.1926 ; 2014. |
| Language Note: | En inglés. |
Search for related items by subject
| Subject: | Electrones > Difracción. Cristales > Defectos > Análisis. Difracción. |
Search for related items by series
Available copies
- 1 of 1 copy available at IPICYT.
Holds
- 0 current holds with 1 total copy.
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| Location | Call Number / Copy Notes | Barcode | Shelving Location | Status | Due Date |
|---|---|---|---|---|---|
| Biblioteca Ipicyt | QC721M6 L3 2002 | AVA00593 | Coleccion General | Available | - |
| LDR | 00620nam a2200250zi 4500 | ||
|---|---|---|---|
| 001 | 42792 | ||
| 003 | CONS | ||
| 005 | 20140901165230.0 | ||
| 006 | a fr 000 0 | ||
| 007 | ta | ||
| 008 | 1311 s 2002fr a fr 001 0 eng d | ||
| 020 | . | ‡a9782901483052 | |
| 040 | . | ‡bspa ‡erda | |
| 041 | 0 | . | ‡aeng |
| 050 | 0 | 0. | ‡aQC721 ‡bM6 L3 2002 |
| 100 | 1 | . | ‡aMorniroli, Jean Paul. |
| 245 | 1 | 0. | ‡aLarge-angle convergent-beam electron diffraction (LACBED) : ‡bapplications to crystal defects / ‡cJean Paul Morniroli. |
| 246 | 3 | . | ‡aLACBED |
| 264 | 1. | ‡aParis : ‡bSociété Française des Microscopies, ‡c[2002]. | |
| 264 | 4. | ‡ac2002. | |
| 300 | . | ‡axii, 431 páginas : ‡bilustraciones ; ‡c23 cm. | |
| 336 | . | ‡atexto ‡btxt ‡2rdacontent | |
| 337 | . | ‡asin medio ‡bn ‡2rdamedia | |
| 338 | . | ‡avolumen ‡bnc ‡2rdacarrier | |
| 490 | 0 | . | ‡aMonograph of the French Society of Microscopies |
| 504 | . | ‡aIncluye bibliografía e índice. | |
| 541 | . | ‡fIPICYT ; ‡cProyecto / Dr. Miguel Avalos Borja / CONACYT-FONDOS Sectoriales-SEP-S-3172 / R.1632-P.1926 ; ‡d2014. | |
| 546 | . | ‡aEn inglés. | |
| 650 | 0. | ‡aElectrones ‡xDifracción. | |
| 650 | 0. | ‡aCristales ‡xDefectos ‡xAnálisis. | |
| 650 | 0. | ‡aDifracción. | |
| 901 | . | ‡a42792 ‡b ‡c42792 ‡tbiblio ‡sSystem Local | |
