Fundamentals of power diffraction and structural characterization of materials / Vitalij K. Pecharsky and Peter Y. Zavalij.
Record details
- ISBN: 9780387095783
- Physical Description: xiii, 741 páginas : ilustraciones ; 24 cm.
- Edition: Second edition.
- Publisher: New York, NY : Springer, [2009].
- Copyright: c2009.
Content descriptions
| Bibliography, etc. Note: | Incluye bibliografía e índice. |
| Immediate Source of Acquisition Note: | IPICYT ; Proyecto/Dr. Jose Luis Sánchez Llamazares/CONACYT-3953 Programa de fortalecimiento académico del Posgrado/R.3248 ; 2014. |
| Language Note: | En inglés. |
Search for related items by subject
| Subject: | Polvos > Propiedades ópticas > Medición. Rayos X > Difracción > Medición. Cristalografía de rayos X. |
Available copies
- 2 of 2 copies available at IPICYT.
Holds
- 0 current holds with 2 total copies.
Show Only Available Copies
| Location | Call Number / Copy Notes | Barcode | Shelving Location | Status | Due Date |
|---|---|---|---|---|---|
| Biblioteca Ipicyt | QC482P4 F8 2009 | AVA00607 | Coleccion General | Available | - |
| Biblioteca Ipicyt | QC482P4 F8 2009 | AVA00608 | Coleccion General | Available | - |
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